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Prof. D. Ioan
| Speaker: |
Prof. Daniel Ioan ("Politehnica" University of Bucharest, Romania) |
| Date: |
Wednesday April 23, 2003 |
| Title: |
Use of Dual Finite Integration Technique (DFIT) for accuracy control
of electromagnetic field numerical computation |
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Abstract
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The paper proposes a method of improving the efficiency
of classical Finite Integration Technique (FIT), aiming to control the accuracy
of the numerical solution of electromagnetic field equations in static and
quasistatic regimes.
The global variables (voltages and fluxes) are used as DOFs like in FIT,
but unlike the classical FIT the shape functions are used to obtain the
Hodge's operator, similar to the Whitney (Edge) Finite Element Method approach.
Each of the two staggered FIT grids is used as electric and magnetic network
as well. This dual approach allows the control of the numerical solution
accuracy and the control of the adaptive (global or local) mesh refinement.
The Richardson acceleration applied to DFIT was successfully used for fast
extraction of RLC parameters in ULSI circuits. Using the same computational
resources, DFIT resulted in a better solution than FIT, with 50 times less
DOFs. |
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